Technical Papers |
Ref |
Title |
Company |
Author |
Subject |
Nbr Pages |
File Size |
Download File |
Year Pub. |
1 |
THERMAL CYCLING RELIABILITY ASSESSMENT OF A CERAMIC COLUMN GRID ARRAY PACKAGE FOR SPACE APPLICATIONS |
NASA JPL Jet Propulsion Laboratory |
Rajeshumi Ramesham, Ph.D. |
Assembled daisy chain CN1752 , inspected boards nondestructively, and then subjected them to thermal cycling to assess reliability in thermal environments from +125°C to -40°C |
11 |
1Mb |
PDF |
2016 |
2 |
CCGA Column Attachment |
TopLine Corporation |
Martin Hart |
CCGA Column Attachment for Absorbing Large CTE Mismatch |
7 |
1Mb |
PDF |
2015 |
3 |
Solder Columns Space Parts Working Group |
TopLine Corporation |
Martin Hart |
Solder Columns for CCGA Substrates |
15 |
1Mb |
PDF |
2014 |
4 |
Reliability of CGA/LGA/HDI Package Board/Assembly |
NASA JPL Jet Propulsion Laboratory |
Reza Ghaffarian, Ph.D. |
Test data for CGA1752, CGA1272 and CGA1517 packages. 1.0mm pitch. Plain Columns, Copper Wrap Columns and Micro-coil Spring. Visual, SEM, and thermal cycle evaluations to determine integrity of chip capacitors on package. |
44 |
5Mb |
PDF |
2013 |
5 |
Microcoil Spring interconnects for Ceramic Grid Array Integrated Circuits |
NASA - Marshal Space Flight Center |
Mark Strickland Jimmy Hester J.F. Blanche T.S. Nash |
Novel micro-coil spring interconnect for Ceramic Grid Array - CCGA to replace solder balls and traditional solder columns. |
24 |
4Mb |
PDF |
2011 |
6 |
Study of Ceramic Column Grid Array Components for Space Systems |
Northop Grumman |
Jonathan Fleisher Walter Willing |
Paper addresses using CCGA in high reliability space systems and issues of thermal mismatch between ceramic substrate and traditional PWB. |
6 |
1Mb |
PDF |
2011 |
7 |
Ceramic Column Grid Array Design and Manufacturing Rules
for Flight Hardware |
NASA Goddard Space Flight Center |
GSFC-STD-6001 |
Mounting of CCGA onto PCB to provide uniform engineering and technical requirements for processes, procedures, practices, and methods that have been endorsed as standard for NASA programs |
21 |
1Mb |
PDF |
2011 |
8 |
Reliability of High I/O High Density CCGA Interconnect Electronc Packages under Extreme Thermal Environments. |
NASA JPL Jet Propulsion Laboratory |
Rajeshumi Ramesham, Ph.D. |
CCGA1152 and CCGA1272 packages paper provides experimental test results of advanced CCGA packages tested in extreme temperature thermal environments. |
15 |
2Mb |
PDF |
2011 |
9 |
Reliability of CCGA Under Extreme Temperature for Space Applcations |
NASA JPL Jet Propulsion Laboratory |
Rajeshumi Ramesham, Ph.D. |
Mounting of 8 Daisy Chain CCGA717 packages on PCB and evaluation under temperature cycling from -185°C to +125°C for space applcations |
9 |
4Mb |
PDF |
2010 |
10 |
Thermal Performance of Micro-Springs in Electronic Systems |
NASA Marshall Space Flight Center |
Allison Copus Reviewed by Jeff Brown |
Internship Report using 3D modeling Pro-Engineer & thermal simulation IcePro and IcePak to model comparision of Micro-coil Springs to solder balls in vacuum conditions and to characterize their thermal performance. |
7 |
1Mb |
PDF |
2009 |
11 |
Thermal Cycle Reliability Failure Mechanisms
CCGA and PBGA With and Without Corner Staking |
NASA JPL Jet Propulsion Laboratory |
Reza Ghaffarian, Ph.D. |
Comparing Plastic Ball grid array (PBGA) to CCGA560 ceramic column grid array, inspection, thermal cycle solder joint, stake. Revision of 2006 paper |
12 |
1Mb |
PDF |
2008 |
12 |
Column Grid Array Rework For High Reliability |
NASA JPL Jet Propulsion Laboratory |
Atul Mehta & Charles Bodie |
Questions and challenges: Is the reliability of the PWB adversely affected by rework. How many times can rework the same board without destroying a pad or degrading lifetime? |
11 |
6Mb |
PDF |
2008 |
13 |
Solder Column Qualification for Ceramic Column Grid Array (CCGA) |
Aeroflex |
Author not cited |
The test vehicle used in this study was a 472 pin daisy chain CCGA package. Revision of 2006 paper |
16 |
2Mb |
PDF |
2008 |
14 |
Atmel CCGA625 Mounting Evaluation |
SAAB
|
Stanley Mattsson |
Mounting and evaluation of CCGA625 daisy chain on PCB |
31 |
8Mb |
PDF |
2007 |
15 |
CCGA packages for space applications |
NASA JPL Jet Propulsion Laboratory |
Reza Ghaffarian, Ph.D. |
Commercial-off-the-shelf (COTS) CCGA560 and CCGA717 area array packaging technologies reliability study Space Shuttle and Mars Rover missions. |
19 |
3Mb |
PDF |
2006 |
16 |
Design Parameters Influencing Reliability of CCGA Assembly: A
Sensitivity Analysis |
NASA JPL Jet Propulsion Laboratory |
Reza Ghaffarian, Amaneh Tasooji, Antonio Rinaldi |
Finite Element Method (FEM) analysis has been conducted to assess
the state of the stress/strain in CCGA assembly under different thermal cycling, and to explain the different failure modes and
locations observed in JPL test assemblies. |
8 |
1Mb |
PDF |
2005 |
17 |
Comparison of X-Ray Inspection Systems of BGA/CCGA Quality Assurance and Crack Detection |
NASA JPL Jet Propulsion Laboratory |
Reza Ghaffarian, D. Mih |
Using X-Ray as an inspection tool for detecting defects and cracks in CCGA |
7 |
2Mb |
PDF |
2005 |
18 |
Reliability Testing and Data Analysis of an 1657 CCGA (Ceramic
Column Grid Array) Package with Lead-Free Solder Paste on Lead-Free PCBs (Printed Circuit Boards) |
Agilent Technologies |
Author not cited |
Comparision of CCGA1657 Pb90/Sn10 using Lead Free Solder Paste and various PC Board Finish |
25 |
.5Mb |
PDF |
2004 |
19 |
JEDEC Standard MO-158D |
JEDEC |
JEDEC JC-11 Committee |
Square CCGA Outlines |
8 |
.2Mb |
PDF |
2002 |
20 |
JEDEC Standard MO-159B |
JEDEC |
JEDEC JC-11 Committee |
Rectangular CCGA Outlines |
6 |
.3Mb |
PDF |
1999 |
21 |
Solder Column CCMD Test Report on Serial Thermal Cycle, Shook, and Vibration Tests |
Raychem |
- |
Improved temperature life cylces using copper wrapped solder columns on ceramic LCC periemter array |
28 |
12Mb |
PDF |
1987 |
Industry & Market |
Ref |
Title |
Source |
Language |
Subject |
File Size |
File Type |
Year Pub. |
1 |
Robust FPGA Supply Chain Assures Defense Industry Preparedness |
Military Embedded Magazine June 2021 |
English |
In the world of defense-grade FPGA devices, solder column attachment is the weakest
link in the assembly process. Today, 90% of America’s FPGA device makers rely on a single subcontractor to attach solder columns, creating a potential
supply chain vulnerability. The problem can be solved by engaging multiple subcontractors already established throughout North America. Device makers just need to qualify these
alternative subcontractors in order to assure sustainability and resiliency of the defense-grade FPGA supply. |
1Mb |
PDF
HTML |
2021 |
2 |
Does FPGA Industry Face Peril? |
MEPTEC REPORT |
English |
The entire supply chain relies on an uninterrupted
supply of solder columns, the last step in the manufacture of aerospace and defense grade LGA packaged FPGA components. |
1Mb |
HTML |
2021 |
3 |
FPGA Issues and Concerns: A Real Danger and a Call to Action |
Printed Circuit Design & Fab Circuits Assembly Magazine August 2020 |
English |
The reality of a brittle supply chain could mean harsh consequences for failure to delivery of defense-grade FPGA supply. |
1Mb |
PDF
HTML |
2021 |
4 |
Solder Columns for Quantum Computers and Cryogenic Applications |
US Tech Magazine July 2024 |
English |
Some applications, including quantum computers, perform better at cryogenic temperatures, below the superconductivity point. This is because electrical resistance drops to zero when certain materials become superconductive, allowing current to flow without energy loss. |
1Mb |
PDF
HTML |
2024 |